Q-Sense Ellipsometry Module launched

Thursday, October 01, 2009

The latest module in Q-Sense product portfolio is a new combination module that enables QCM-D and ellipsomtric measurements on the same surface. Both measurements are conducted simultaneously in situ, in a flow and temperature controlled chamber.

Being able to conduct QCM-D and optical analysis at the same time on the same sensor opens up for analysis of more complex systems. The launch of this new module is an exciting development, and in line with Q-Sense philosophy to be at the front of technical and scientific development and research.