Ellipsometry Module

The Q-Sense Ellipsometry Module is a module that fits in the Q-Sense E1 system, and enables simultaneous QCM-D and ellipsometric measurements on the same substrate. Both QCM-D and ellipsometric measurements are conducted in situ in the flow- and temperature-controlled chamber.

As the complexity of the studied systems increases, one technique alone is sometimes not enough to provide all the desired information. Multi-technique approaches provide complementary information, and can in those cases allow a more complete analysis. Therefore, merging several techniques into the same setup and monitoring events on the same surface is a promising approach.

 

Read our application example: Combined QCM-D / Ellipsometry setup for real-time characterization of thin molecular films.

To learn more on the setup, read our QCM-D / Ellipsometry technology note.

Further specification on this module, read the Q-Sense Ellipsometry Module product sheet.

For more information on our applications, products and the QCM-D technology, you are always welcome to contact us.